麻省理工学院:《Robust System Design》Term Project Final presentation

Term project Final presentation Visual aids available on-campus Computer projection Document camera Camera Visual aids available off-campus Camera OR-- Send me your slides electronically and Ill project them from my laptop mit 人 16881
Term Project Final Presentation • Visual aids available on-campus – Computer projection – Document camera – Camera • Visual aids available off-campus – Camera – OR -- Send me your slides electronically and I’ll project them from my laptop 16.881 MIT

Term Project G raging Term project is 30% of course grade Written report is 75% of term project Due on last Lecture day 10% penalty per day late Final presentation is 25% of term project mit 人 16881
Term Project Grading • Term project is 30% of course grade • Written report is 75% of term project – Due on last Lecture day. – 10% penalty per day late • Final presentation is 25% of term project 16.881 MIT

Term Project Final Presentation schedule Tom Hoag, Designing a robust business Chip Clampitt, "The Use of Orthogonal Arrays to Optimize nonlinear Functions Iteratively Karl hauenstein, "Robust design of a voltage controlled oscillator Boran, Goran, Pepin, Shashlo, Wickenheiser, Robust System Design Application/Integration-Ford Motor Company Joe Distefano, "Application of robust Design Techniques to a Paper Winding Simulation Garth Grover, "HPT Dovetail 2-D Form Robust Design Shelley hayes, "Taguchi Method Meets Publish and Subscribe mit 人 16881
Term Project Final Presentation Schedule • Tom Hoag, “Designing a Robust Business” • Chip Clampitt, “The Use of Orthogonal Arrays to Optimize Nonlinear Functions Iteratively” • Karl Hauenstein, “Robust Design of a Voltage Controlled Oscillator” • Boran, Goran, Pepin, Shashlo, Wickenheiser, “Robust System Design Application / Integration - Ford Motor Company” • Joe Distefano, “Application of Robust Design Techniques to a Paper Winding Simulation” • Garth Grover, “HPT Dovetail 2-D Form Robust Design” • Shelley Hayes, “Taguchi Method Meets Publish and Subscribe” 16.881 MIT

Term Project Final presentation schedule. Cont Wei zhao, Taguchi and beyond- Methodologies for experimental Designs J. Philip Perschbacher, Robust Design of Blade Attachment Device Michelle martucci, "Allied Signal's Six Sigma Initiative: A Robust Design Case Study Steve Sides, Bob Slack, Coating Technology for Jet Aircraft Engines Ebad Jahangir, Robust Design and its relationship with axiomatic Design Tom Courtney "Robust Thermal Inkjet Printhead design David Markham, " Robustness Testing of a Film-Scanner Magnetic Module mit 人 16881
Term Project Final Presentation Schedule, Cont. • Wei Zhao, “Taguchi and Beyond - Methodologies for Experimental Designs” • J. Philip Perschbacher, “Robust Design of Blade Attachment Device” • Michelle Martuccio, “Allied Signal's Six Sigma Initiative: A Robust Design Case Study” • Steve Sides, Bob Slack, “Coating Technology for Jet Aircraft Engines” • Ebad Jahangir, “Robust Design and its Relationship with Axiomatic Design”. • Tom Courtney “Robust Thermal Inkjet Printhead Design” • David Markham, “Robustness Testing of a Film-Scanner Magnetic Module” 16.881 MIT

Robust Conceptual design Considering variation early in the Design process DIEL PNN PUIR LEYEL, LEYER2 H日 DOYA PIN 人 16881
Robust Conceptual Design Considering Variation Early in the Design Process 16.881 MIT

Outline Motivation Tools and tricks - tRIZ etc A framework --RCdm wafer handling case Case study --VMa prehensor Case study -- Adhesive application in LBPs mit 人 16881
Outline • Motivation • Tools and tricks -- TRIZ, etc. • A framework -- RCDM & wafer handling case • Case study -- VMA prehensor • Case study -- Adhesive application in LBPs 16.881 MIT

Quality in Product Development Quality efforts used to be focussed here Concept System Detail Testing and Production Customer Development Design Design Refinement Ramp-up use But 80%o Taguchi Methods of quality is of parameter design determined here Induce noise X16.881 Source: Ulrich and Eppinger, Product Design and Development
Quality in Product Development Quality efforts used to be focussed here determined here! Concept Development System Design Detail Design Testing and Refinement Production Ramp-up But 80% of quality is Custo m er use Taguchi Methods of parameter design Induce noise 16.881 Source: Ulrich and Eppinger, “Product Design and Development” MIT

Concept design The Window of Opportunity Window of opportunity Quality determined 100 costs committed 75 50 25 Design flexibility 哥 ource Russell B Ford and 人 16881 Lifecycle phase 2 Philip barkan
Concept Design: The Window of Opportunity Quality determined & costs committed Design flexibility Window of opportunity 100 Percentage of total Problem 75 50 25 Manufacture Use definition Concept Detail design designSource: Russell B. Ford and 16.881 Lifecycle phase Philip Barkan

Concept versus Parameter Design Concept Design Parameter Design Begins with broad specs Begins with system design Free wheeling, intuitive · Bounded, systematic · One off experiments · Orthogonal arrays Rough analysis Precise analysis Requires insight Can be implemented as a black box Source: Russell B. Ford and Philip barkan mit 人 16881
Concept versus Parameter Design Concept Design • Begins with broad specs • Free wheeling, intuitive • One off experiments • Rough analysis • Requires insight Parameter Design • Begins with system design • Bounded, systematic • Orthogonal arrays • Precise analysis • Can be implemented as a “black box” Source: Russell B. Ford and Philip Barkan 16.881 MIT

Biggest roadblocks in Concept design Poor problem formulation Stopping with too few alternatives Failure to search existing solutions Missing entire categories of solutions Inability to merge solutions 16.881 Source: Ulrich and Eppinger, "Product Design and Development" MIT
Biggest Roadblocks in Concept Design • Poor problem formulation • Stopping with too few alternatives • Failure to search existing solutions • Missing entire categories of solutions • Inability to merge solutions 16.881 Source: Ulrich and Eppinger, “Product Design and Development” MIT
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