上海交通大学：《Structural and Chemical Characterization of Materi》教学资源_Powder X-ray diffraction method and applications

Powder X-ray diffraction method and applications 口妥 丹a

Powder X-ray diffraction method and applications

Powder X-ray diffraction Ewald's sphere Incident beam 20 024 133 111 002 004 222113 022 2

Powder X-ray diffraction 2

Powder X-ray diffraction Ewald's Diffraction sphere cone Incident beam

Powder X-ray diffraction

Powder X-ray diffraction 。Instrumentation -Goniometer and monochromator -System aberrations Samples and data acquisition -Distortion of diffraction pattern Phase identification Data acquisition/processing -Qualitative and quantitative analysis -Search/analysis software

Powder X-ray diffraction • Instrumentation – Goniometer and monochromator – System aberrations • Samples and data acquisition – Distortion of diffraction pattern • Phase identification – Data acquisition/processing – Qualitative and quantitative analysis – Search/analysis software

Method 1:Debye-Scherrer camera Sample Film Trap Collimator Bragg angle,0(from o to 90)

Method 1: Debye-Scherrer camera

Method 2:X-ray diffractometer 射仪) LaNiSn.sCu Ko 2.0 55 X'Per 1.5 1.0 113,K1 032,KC 131,Ka 113,K02 0.5 032,Ka2 131,Ko2 0.0 80 81 82 83 84 人人人 40 50 60 70 80 90 100110120 Bragg angle,20(deg.)

Method 2: X-ray diffractometer ( 衍 射仪 )

0-20 instrument Bragg-Brentano geometry counter& pre-amplifier divergence scatter counter driven at 28per min slit slit sample driven at receiving H.T.supply, slit chart recorder 寻 and counting X-ray electronics tube powdered and sample goniometer hand drive shield .goniometer 20 position Goniometer(测角仪)

2 instrument Goniometer (测角仪) Bragg-Brentano geometry

0-0 instrument >Detector X-ray tube 20 Detector Mono- chromator Divergence slit Antiscatter slit Detector X-ray slit source Sample

 instrument

Essential Parts of the Diffractometer X-ray Tube:the source of X Rays Incident-beam optics:condition the X-ray beam before it hits the sample The goniometer:the platform that holds and moves the sample,optics,detector,and/or tube The sample sample holder e Receiving-side optics:condition the X-ray beam after it has encountered the sample Detector:count the number of X Rays scattered by the sample

Optical arrangement for thin film (p.63 of textbook) X-ray Detector Collimator <1° Glancing angle Figure 2.16 Optical arrangement for thin film diffractometry. Parallel rather than divergent incident beam Monochromator between incident beam and the sample

Optical arrangement for thin film Glancing angle (p.63 of textbook) • Parallel rather than divergent incident beam • Monochromator between incident beam and the sample